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TG-JVD
● Atomic emission spectroscopy with high accuracy.
● High-frequency high-voltage ionization source ensures excellent stability without radioactive concerns.
● No consumable components, ensuring long instrument lifespan.
● High-precision MFC for sample gas flow control.
● Color LCD display with clear information presentation. Touchscreen operation for user-friendly experience.
● 4-20mA current loop output.
● Atomic emission spectroscopy with high accuracy.
● High-frequency high-voltage ionization source ensures excellent stability without radioactive concerns.
● No consumable components, ensuring long instrument lifespan.
● High-precision MFC for sample gas flow control.
● Color LCD display with clear information presentation. Touchscreen operation for user-friendly experience.
● 4-20mA current loop output.
● Typical Range: 0~10×10-6 ; 0~100×10-5
● Operating Temperature: (5-40)℃
● Stability: ± 1% FS/24h
● Repeatability: 0.5%
● Linearity Deviation: ± 1% FS
● Response Time (Tgo): ≤30s
● Sample Gas Temperature: 5~40℃
● Sample Gas Flow Rate: 50 mL/min~150mL/min
● Moisture Content: Dew Point ≤4℃
● Particulate Content: ≤0.1um
● Free from Impurity Gases (O2, CH4, H2, CO)
● Typical Range: 0~10×10-6 ; 0~100×10-5
● Operating Temperature: (5-40)℃
● Stability: ± 1% FS/24h
● Repeatability: 0.5%
● Linearity Deviation: ± 1% FS
● Response Time (Tgo): ≤30s
● Sample Gas Temperature: 5~40℃
● Sample Gas Flow Rate: 50 mL/min~150mL/min
● Moisture Content: Dew Point ≤4℃
● Particulate Content: ≤0.1um
● Free from Impurity Gases (O2, CH4, H2, CO)
1.Metal Smelting & Welding
Special steel smelting: Nitrogen impurities in argon during AOD furnace refining or rare metal (Ti/Zr) melting may alter mechanical properties.
High-end welding shielding gas: Nitrogen contamination in TIG welding of stainless steel/aluminum may cause weld embrittlement.
2.Semiconductor & Electronics Manufacturing
High-purity gas monitoring: Detects trace nitrogen (ppb-level) in process gases (Ar/H₂/He) during wafer fabrication, etching, or CVD/PVD deposition to prevent device performance degradation.
Electronic specialty gas QC: Nitrogen impurity detection in gases like silane (SiH₄) or ammonia (NH₃).
3.Photovoltaics & Solar Cells
Silicon wafer production: Monitors nitrogen levels in argon shielding gas during monocrystalline/polycrystalline growth to prevent lattice structure defects.
Thin-film battery processes: Nitrogen contamination in CIGS/perovskite solar cell fabrication may cause thin-film defects.
1.Metal Smelting & Welding
Special steel smelting: Nitrogen impurities in argon during AOD furnace refining or rare metal (Ti/Zr) melting may alter mechanical properties.
High-end welding shielding gas: Nitrogen contamination in TIG welding of stainless steel/aluminum may cause weld embrittlement.
2.Semiconductor & Electronics Manufacturing
High-purity gas monitoring: Detects trace nitrogen (ppb-level) in process gases (Ar/H₂/He) during wafer fabrication, etching, or CVD/PVD deposition to prevent device performance degradation.
Electronic specialty gas QC: Nitrogen impurity detection in gases like silane (SiH₄) or ammonia (NH₃).
3.Photovoltaics & Solar Cells
Silicon wafer production: Monitors nitrogen levels in argon shielding gas during monocrystalline/polycrystalline growth to prevent lattice structure defects.
Thin-film battery processes: Nitrogen contamination in CIGS/perovskite solar cell fabrication may cause thin-film defects.